About us

Bruker Nano's X-ray systems and components for elemental and structural analysis on the micro- and nanoscale include analytical tools for electron microscopes as well as mobile benchtop Micro-XRF and TXRF spectrometers.

The M1 MISTRAL is a compact tabletop Micro-XRF spectrometer for the non-destructive analysis of bulk materials and coatings.

Designed for fast and cost-efficient operation it provides accurate information on the elemental composition of materials.

Products and services

M1 MISTRAL

Non-destructive analysis of bulk materials and coatings

Fast, cost-efficient and maintenance-free

Accurate determination of precious metal content

High spatial resolution and spot sizes down to 100 µm

Analysis of arbitrarily shaped samples without sample preparation

Measurement at exact desired sample position

Determination of RoHS compliance

Plating thickness measurement of metallic multilayer stacks

Easy to use without prior knowledge in XRF

M1 MISTRAL

Non-destructive analysis of bulk materials and coatings
Fast, cost-efficient and maintenance-free
Accurate determination of precious metal content
High spatial resolution and spot sizes down to 100 µm
Analysis of arbitrarily shaped samples without sample preparation
Measurement at exact desired sample position
Determination of RoHS compliance
Plating thickness measurement of metallic multilayer stacks
Easy to use without prior knowledge in XRF

Address
Bruker Nano GmbH
Am Studio 2D
12489 Berlin
Germany

Phone: +49 30 6709900
Internet: www.bruker.com/micro-xrf
E-mail: Send message

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